Particle characterization evaluates particle size and shape, along with the physical and chemical properties of the sample, to identify the particular particles of the sample in such a way that allows for comparisons between several samples. This gives manufacturers the data necessary to evaluate the quality of one batch of material to another, allowing for product testing evaluations and quality control.
In order to help clarify the different types of particle information available, the American Society for Testing and Materials (ASTM) has implemented standards for particle characterization, ASTM E1617. ASTM breaks down this information into three levels. The first level gives very basic information about the material. The second level provides more of the methodology applied to produce the first level of information. The third level provides enough details that the procedure can be reproduced. Even though this information may seem to leave little room for error, the way in which the particles are measured, such as differences in handling, acquisition, preparation, and particles size measurement ranges, can have a vast impact on the resulting ASTM level.
Particle characterization requires the analyzer to be very specific, being able to size and shape particles in the sub-micron range. It is more practical to use an automated electron-beam instrument than optical, laser diffraction, or gravimetric instruments, due to electron-beam analyzers having superior magnification ranges, greater depth of field, and more powerful contrast mechanisms. When coupled with x-ray analysis technology, particle composition can also be determined and classified. Since particle analysis influences many of the choices manufacturers make about how products are combined, having a top-of-the-line particle characterization tool becomes necessary.
Responding to trends put forth by these manufacturers, Aspex has created the industry’s only totally integrated solution for the automated detection, identification, and characterization of micron-level debris, specifically designed with the automotives manufacturing and cleansing operations in mind. The Aspex Personal Scanning Electron Microscope (PSEM) with Advanced Quality Control (AQC) software is revolutionizing the way particles are being detected, using its industrial electron beam analyzers to quickly scan and identify particles, insuring product cleanliness protocols are being upheld.
The Aspex PSEM with AQC software can help manufacturers identify, size, and characterize particles that could otherwise lead to product failure, and can reduce automakers manufacturing and warranty failures by upwards of 30%. With an easy to use interface and plenty of analysis options, the PSEM by Aspex is changing the way manufacturers look at particles characterization.
Reference:
Aspex, http://www.aspexcorp.com/industries/industrial-automation.html
ASTM, http://www.astm.org/Standards/E1617.htm
