NAME THAT SAMPLE! – WEEK 2

And the winner is …. or at least, the person that guessed closest is to what was scanned by our scanning electron microscope is …
AMANDA!
She guessed Taffey!
Great guess Amanda, it’s actually a starburst fruit chew. Congrats Amanda! You’ll be contacted directly and we’ll send you your USB stick and giftcard within the next few days!


It’s week 2 of “NAME THAT SAMPLE!”

Week 1 was pretty fun … we had some great guesses (and some not so great ones) … but all guesses/entries are encouraged.

This one is definitely a hard one. Whoever guesses correctly first will win a 1GB ASPEX USB STICK. (winner will be contacted via email) AND a $50 Giftcard to Amazon.com (we’re upping the stakes on this one since no oone has guessed correctly in over a week.)

Just comment below with your guess! The contest was supposed to end on Friday, but since no one has guessed correctly, we’re going to let it run for a few more days ..

UPDATE: December 19, 2009 – Noone has guessed correctly. A few people have come pretty close though. Let the guesses keep coming in!

UPDATE: December 22, 2009 – WE HAVE A WINNER! or someone that has answered pretty close … we will announce it later today! Our next NAME THAT SAMPLE campaign will start TONIGHT!

Interested in sending in an item to get scanned by one of our SEM’s? Just Send Us Your Sample!

System Configuration
Product: PSEM® eXpress
Operating Parameters: VP–BSED Detector,
Accelerating Voltage 20.0 kV,
Working Distance 14.4 mm
Reporting Software: Personal Image Print™


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Name that Sample! WEEK 1

And the winner is … SAM!

He guessed correctly … it was a “Post It Note”

Congrats SAM! You’ll be contacted for your address so that we can send you your ASPEX USB stick! Below were the details for the Name that Sample contest, Week 1! Stay tuned for Week 2 coming up! Do you have a sample that you’d like to see on the name that sample contest? Go ahead and Send Us Your Sample Today!


Hello everyone. Because of the huge success we’ve had with our “Send Us Your Sample” campaign … we’re asking everyone to help us NAME THAT SAMPLE!

Whomever guesses whats under our Scanning Electron Microscopes correctly first will win a 1GB ASPEX USB STICK. (winner will be contacted via email).

Just comment below with your guess! The contest will end Friday at 11:59PM EST.

Application Introduction
Variable Pressure (VP) facilitates the analysis of non-conductive specimens with SEM instrumentation. Our products employ the Backscattered Electron Detector (BSED) during this analysis mode.

Data Illustrations & Method Description
BSED imaging reflects the elemental surface composition in shades of gray. Carbonaceous phases would be represented in darker tones where as Metallic features would be displayed in brighter tones.

Interested in resolving or illustrating surface features, elemental composition and or an unknown defect? Just Send Us Your Sample!

System Configuration
Product: PSEM® eXpress
Operating Parameters: VP–BSED Detector,
Accelerating Voltage 20.0 kV,
Working Distance 14.4 mm
Reporting Software: Personal Image Print™


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Paper Tears Under an SEM Scanning Electron Microscope

People have torn up their notebooks and sent us their scraps to be scanned under our Scanning Electron Microscopes.







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Chalk Crayon Under an SEM Scanning Electron Microscope

Check out what chalk looks like under our Scanning Electron Microscopes.

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SEM Image Gallery by ASPEX – Send Us Your Sample!

ASPEX is the world’s only SEM Elemental Analysis company that allows anyone to send in their sample to get scanned by our SEM. Ever wondered what something looks like under a scanning electron microscope? You’ve got to see it to believe it.

Here are the instructions. You can find the form by clicking here.

send-us-your-sample



Here’s what a toy bunny looks like under an SEM!

Learn more about this incredible send us your sample campaign!




Here’s a pic of our latest batch of samples … they just keep on comin’






As you can see, we’re working hard getting through all of your samples.





Also, want a free ASPEX envelope opener? Just fill out the form below!


EMAIL:
NAME:
ADDRESS:
CITY:
STATE:
ZIP:



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ASPEX Analytical Services Report for Stir Bar | Chemistry-Blog.com



The kind folks over at Chemistry-Blog.com sent over a stir rod to get scanned under our Scanning Electron Microscopes.

We’ve made a report for you guys, so, here goes:

Stir Rod Analysis
Analysis and reports by:
Ben Abraham, Analyst
babraham@aspexcorp.com

This is what was sent in to us …





SEM parameters used during an analysis:
Instrument: ASPEX eXplorer
Beam Current: 20 KeV
Spot Size: 40%
Working distance: 16.0 mm
Variable Pressure: 0.30 torr
Detector: BSED

Instrument and Software
The Stir Rod was analyzed using the ASPEX PSEM. Chemical composition data was
acquired using a SDD detector with a 30 mmsq- Ultra Thin Window SDD detector.
Reports were prepared using ASPEX imaging reporter.

Testing performed
Backscatter electron detector (BSED) images were collected under variable pressure
conditions (VP set point is 0.3 torr).

Image 1: Image from BSED detector. EDS performed on a particle on the surface.








Element Normalized K-Ratio rounded to first decimal
C 4.2
O 73.9
Al 16.4
Si 5.5


Image 2: Image from BSED detector. EDS performed on a particle on the surface.








Element Normalized K-Ratio rounded to first decimal
C 3.1
O 30.5
Al 0.4
Si 0.5
Fe 65.5


Image 3: Image from BSED detector. EDS performed on a particle on the surface.








Element Normalized K-Ratio rounded to first decimal
C 6.7
O 35.1
Na 5.1
Mg 3.5
Al 2.3
Si 7.2
S 12.1
Cl 10.0
Ca 4.0
Fe 3.1
Zn 11.0


Image 4: Image from BSED detector. EDS performed on a particle on the surface.








Element Normalized K-Ratio rounded to first decimal
C 4.6
O 29.3
Al 1.0
Si 0.3
Cr 64.6


Image 5: Image from BSED detector. EDS performed on a particle on the surface.








Element Normalized K-Ratio rounded to first decimal
C 2.9
O 33.6
Al 49.0
Si 14.4


Image 6: Image from BSED detector. EDS performed on a particle on the surface.








Element Normalized K-Ratio rounded to first decimal
C 12.1
O 4.0
F 80.1
Al 3.9
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Wood under an SEM Scanning Electron Microscope by ASPEX

Chunks of wood were sent to ASPEX to be scanned under our Scanning Electron Microscopes.

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Hard Candy Under an SEM Scanning Electron Microscope

Yummy candy scanned by our Scanning Electron Microscopes. ASPEX thinks the SEM picture looks tastier.

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Granite Under an SEM Scanning Electron Microscope

Granite pieces under our Scanning Electron Microscopes.





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Analyze Oil Contamination – Particulate Analyzers with SEM

Oil contamination in automotive machinery can come either from the mechanical parts themselves or from foreign materials introduced into the system. The majority of mechanical faults and downtime is thought to be from oil contamination, along with the majority of hydraulic and lubrication problems. And, since hydraulic fluid is such a necessary component for any type of manufacturing equipment, the oil must be filtered, analyzed, and replaced. However, even with doing all of these things, there are still downtimes that occur when pumps, valves, cylinders and the like must be replaced do to faulty lubrication.

Oil contamination can happen in several ways. These include fragments left from the manufacturing process, decomposition of components, and manufacturing residue from tools used to create the machinery. General wear and tear on the mechanism also can contribute to oil contamination, friction causing pieces of the machinery to flake off into wear debris that make its way into the oil. Simply replacing the pumps and valves doesn’t cause the contamination to disappear, as even new these pieces can have dirt or other manufacturing debris in them.

In order to combat oil contamination, whether for the reduction of warranty costs, to improve the reliability of the mechanism, or to diagnose an early-warning mechanism for failure, steps must be taken at each level of production and usage. The particle count method has become the most popular analytical tool to assess oil contaminants and find that rare particle that can be the warning signs of a failure of a mechanism. While there are several options for contamination analysis, particle analyzers are as quick and accurate as electron beam analysis.

The Aspex Personal Scanning Electron Microscope (PSEM) has several different software platforms to fit all your analytical needs. The Advanced Quality Control (AQC) software provides manufacturers with the capability of evaluating the size, shape, and composition of all particles present in a sample. Whether in the lab or in the shop, the PSEM with AQC software provides the manufacturer with quick analysis and one click reporting to find the contamination in the oil.

Whether equipped with just the Perception Suite, or with the AQC software, the PSEM from Aspex is a powerful tool for particle contamination analysis in oil.

Reference:

Aspex, http://aspexcorp.com/industries/industrial-automation.html, http://aspexcorp.com/industries/industrial-automation-implementation.html, http://aspexcorp.com/industries/industrial-automation-cleanliness-reporting.html

AllBusiness, http://www.allbusiness.com/chemicals/petrochemicals-industry-petrochemicals-solvents/11447112-1.html

Triple R, http://www.triple-rrr.com/contamination-of-oil.html

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