Benchtop SEM
New Benchtop SEM Analyzer
Delivers More Features, More Samples, Less Cost
Pittsburgh, PA – March 05, 2009 – ASPEX Corporation (ASPEX) has developed the PSEM eXpress™, a new benchtop analyzer that is smaller and more cost-effective than traditional scanning electron microscopes (SEMs). The system will debut at Pittcon 2009, from March 8-13, in Booth 3760.
Starting at $75,000, the PSEM eXpress™ quickly accommodates real-world specimens with 80 mm x 100 mm stage travel, SDD-EDS capability, and a simple user interface. Comparable in size to a laser printer, it detects particles from 100 nm to 5 mm with 25 nm resolution. The instrument is cGMP compliant and can be used to address quality control issues in a variety of industries, including forensics, health sciences, industrial automation, and metals.
“The PSEM eXpress™ represents several new advancements in particle analysis,” said Greg Ott, CEO of ASPEX. “Not only does the PSEM eXpress™ offer standard SEM/EDS functionality at a smaller form and price point, it also has the largest chamber in its class. We are excited to provide these features in a system that offers the lowest cost of ownership industry-wide.”
Visit the PSEM eXpress product page to learn more about this revolutionary desktop SEM.
Demo the PSEM eXpress >>
Its full-service headquarters are located in Pittsburgh, PA. Additional information about ASPEX and its tools for particle size analysis is located at http://www.aspexcorp.com.
